Technology of Simple Structure, Long Durability
F2010-K is a high-speed optical laser micrometer based on laser
diffraction principle. It is fast enough to provide diameter, lumps
and necks measurement in 2-axis.
Extremely short exposure time of 0.5us
Featuring an incredibly short exposure time, F2010-k is good at
capturing object images without any blur or shadow, ensuring
precise measurement accuracy.
Applications
Touch Screen,Computer,Cellphone
DALA F2010-K can be managed by computer ,cellphone and Touch
screen,like parameter setting ,measurement data management ,
and so on,customers can choose as their application request.
Technical Specification
| Model | F2010-K |
|---|
| Axis | 2-axis |
| Measurement data | diameter and ovality, lump and necks |
| Frequency | 10KHz/axis |
| Measurement range | 0.2~10mm |
| Repeatability(1) | ±0.1μm |
| Accuracy(2) | ±(0.0005+0.01%*D)mm |
| Min defect height | 0.01mm |
| Min defect length(3) | 0.2mm(wire speed120m/min)
0.8mm(wire speed500m/min) |
| Size | 155*140*58mm |
| Working power source | 24V ±10% 40VA |
| Running temperature | 5℃~50℃ |
| Display | LED display |
| Commuincation port | Standard:WIFI,RS485 MODBUS RTU,CAN Option:PROFIBUS,PROFINET, EtherNet/IP,EtherCAT,PI feedback control (4) |
| Data colletion & analysis | available (option DS14 ZT display and control system,DMS1000) |
| Out-of-tolerance alarm | available |
| Transparent mode | available |
Note:
(1) set sliding window as 100ms, outside diameter repeatability of
φ1mm round rod at measurement center area
(2) set sliding window as 100ms, outside diameter deviation of φ1mm
round rod at measurement area
(3) set defect measurement average time as 0ms, the minimum defect
length which cannot be missed at the measurable area
(4) PI feedback control is option, but must order at placing order
